Real-Time Examination of Atomistic Mechanisms during Shock-Induced Structural Transformation in Silicon

Stefan J. Turneaure, N. Sinclair, and Y. M. Gupta
Phys. Rev. Lett. 117, 045502 – Published 20 July 2016
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Abstract

The experimental determination of atomistic mechanisms linking crystal structures during a compression-driven solid-solid phase transformation is a long-standing and challenging scientific objective. Using new capabilities at the Dynamic Compression Sector at the Advanced Photon Source, the structure of shocked Si at 19 GPa was identified as simple hexagonal, and the lattice orientations between ambient cubic diamond and simple hexagonal structures were related. The approach is general and provides a powerful new method for examining atomistic mechanisms during stress-induced structural changes.

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  • Received 18 February 2016

DOI:https://doi.org/10.1103/PhysRevLett.117.045502

© 2016 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Stefan J. Turneaure, N. Sinclair, and Y. M. Gupta

  • Institute for Shock Physics and Department of Physics, Washington State University, Pullman, Washington 99164-2816, USA

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Issue

Vol. 117, Iss. 4 — 22 July 2016

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