We propose a scheme for microscopy with resolution far beyond the diffraction limit by using coherent Rabi oscillations. When the sample is illuminated by a gradient laser field, Rabi oscillations will be induced which can lead to a sinusoidal excitation in the sample. This is similar to the structured illumination microscopy (SIM) which can recover high-spatial-frequency components in the far field. However, different from linear SIM, the sinusoidal pattern here can have a spatial frequency much higher than that of the linear standing wave. Due to this property, we can achieve extremely high resolution, as in the nonlinear saturated SIM, but keep the reconstruction algorithm as simple as the linear one.

• Received 13 March 2015

DOI:https://doi.org/10.1103/PhysRevA.91.063811