Hall effect and transmission electron microscopy of epitaxial MnSi thin films

S. A. Meynell, M. N. Wilson, J. C. Loudon, A. Spitzig, F. N. Rybakov, M. B. Johnson, and T. L. Monchesky
Phys. Rev. B 90, 224419 – Published 22 December 2014

Abstract

We present Hall-effect measurements on MnSi/Si(111) epilayers and find an anomalous Hall contribution that is significantly smaller than that in bulk crystals, which enables the observation of an additional contribution to the anomalous signal previously overlooked in MnSi. Our measurements indicate the signal is not due to skyrmions in MnSi thin films, which are absent in out-of-plane fields, but rather are the result of scattering from the cone phase. The absence of magnetic contrast in the transmission electron microscopy (TEM) measurements is consistent with this interpretation [T. L. Monchesky et al., Phys. Rev. Lett. 112, 059701 (2014)]. We provide a method to model TEM images of skyrmion lattices to determine the conditions necessary for their observation in other B20 epilayers with an anisotropy that is favorable to their formation.

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  • Received 22 September 2014
  • Revised 17 November 2014

DOI:https://doi.org/10.1103/PhysRevB.90.224419

©2014 American Physical Society

Authors & Affiliations

S. A. Meynell1, M. N. Wilson1, J. C. Loudon2,*, A. Spitzig1, F. N. Rybakov3, M. B. Johnson1, and T. L. Monchesky1,†

  • 1Department of Physics and Atmospheric Science, Dalhousie University, Halifax, Nova Scotia, Canada B3H 3J5
  • 2Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge CB3 0FS, United Kingdom
  • 3M.N. Miheev Institute of Metal Physics of Ural Branch of Russian Academy of Sciences, Ekaterinburg 620990, Russia

  • *j.c.loudon@gmail.com
  • tmonches@dal.ca

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Vol. 90, Iss. 22 — 1 December 2014

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