Effect of nonstoichiometry on the half-metallic character of Co2MnSi investigated through saturation magnetization and tunneling magnetoresistance ratio

Gui-fang Li, Yusuke Honda, Hong-xi Liu, Ken-ichi Matsuda, Masashi Arita, Tetsuya Uemura, Masafumi Yamamoto, Yoshio Miura, Masafumi Shirai, Toshiaki Saito, Fengyuan Shi, and Paul M. Voyles
Phys. Rev. B 89, 014428 – Published 30 January 2014

Abstract

We investigated the effect of nonstoichiometry on the half-metallic character of the Heusler alloy Co2MnSi (CMS) through the Mn composition (α) dependence of the saturation magnetization per formula unit (μs) of Co2MnαSiβ thin films and the tunneling magnetoresistance (TMR) ratio of CMS/MgO/CMS magnetic tunnel junctions (CMS MTJs) having Co2MnαSiβ electrodes. As a basis for understanding the effect of nonstoichiometry in CMS, we developed a generalized form of the site-specific formula unit (SSFU) composition model, which assumes the formation of only antisite defects, not vacancies, to accommodate nonstoichiometry. The α dependence of μs was well explained by density functional calculations with the coherent potential approximation based on the SSFU composition model for α up to a certain critical value (αc)>1.0. The μs data for Mn-deficient films deviated from the Slater-Pauling predicted data for half-metals due to Co atoms at the nominal Mn sites (CoMn). The theoretical spin polarizations, obtained from only the s- and p-orbital components, Pth(sp), were found to qualitatively explain the α dependence of the TMR ratio except for α > αc. This is in contrast to the theoretical spin polarizations obtained from the s-, p-, and d-orbital components, Pth(spd). A decrease in the TMR ratio observed for CMS MTJs having Mn-deficient electrodes was ascribed to small s- and p-orbital components of the local density of minority-spin in-gap states at the Fermi level that appeared for both antisite CoMn atoms and Co atoms at the regular sites.

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  • Received 9 July 2013
  • Revised 29 December 2013

DOI:https://doi.org/10.1103/PhysRevB.89.014428

©2014 American Physical Society

Authors & Affiliations

Gui-fang Li, Yusuke Honda, Hong-xi Liu, Ken-ichi Matsuda, Masashi Arita, Tetsuya Uemura, and Masafumi Yamamoto*

  • Division of Electronics for Informatics, Graduate School of Information Science and Technology, Hokkaido University, Sapporo 060-0814, Japan

Yoshio Miura1 and Masafumi Shirai1

  • Research Institute of Electrical Communication, Tohoku University, Sendai 980-8577, Japan

Toshiaki Saito1

  • Department of Physics, Faculty of Science, Toho University, Funabashi 274-8510, Japan

Fengyuan Shi1 and Paul M. Voyles1

  • Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706-1595, USA

  • *Corresponding author: yamamoto@nano.ist.hokudai.ac.jp

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Vol. 89, Iss. 1 — 1 January 2014

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