Comparison of van der Waals corrected and sparse-matter density functionals for the metal-free phthalocyanine/gold interface

Johann Lüder, Biplab Sanyal, Olle Eriksson, Carla Puglia, and Barbara Brena
Phys. Rev. B 89, 045416 – Published 21 January 2014

Abstract

In this paper, we report a systematic study on the effect of different van der Waals dispersion correction methods in conjunction with Density Functional Theory on the adsorption characteristics of a monolayer of metal-free phthalocyanine on Au(111). The chosen dispersion corrections were DFT-D2, the Tkatchenko-Scheffler method with and without self-consistent screening, and four sparse-matter density functionals. A comparison among different dispersion corrections was performed and the results are related to available experimental scanning tunnel microscopy and x-ray standing-wave measurements for similar molecules on Au(111). We found that the Tkatchenko-Scheffler method as well as a sparse-matter density functional which employs the exchange potential of optB86b and the nonlocal correlation of Dion describe the adsorbed system, e.g., electronic and geometric structure with an adsorption distance of 3.3 Å, reasonably well within moderate computational costs.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 14 June 2013
  • Revised 17 October 2013

DOI:https://doi.org/10.1103/PhysRevB.89.045416

©2014 American Physical Society

Authors & Affiliations

Johann Lüder, Biplab Sanyal, Olle Eriksson, Carla Puglia, and Barbara Brena

  • Department of Physics and Astronomy, Uppsala University, Box-516, 75120 Sweden

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 89, Iss. 4 — 15 January 2014

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review B

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×