We study the incoherent recombination of topological defects created during a rapid quench of a charge-density-wave system through the electronic ordering transition. Using a specially devised three-pulse femtosecond optical spectroscopy technique we follow the evolution of the order parameter over a wide range of time scales. By careful consideration of thermal processes we can clearly identify intrinsic topological defect annihilation processes on a time scale $\sim 30\mathrm{ps}$ and find a possible signature of extrinsic defect-dominated relaxation dynamics occurring on longer time scales.

• Received 1 August 2012

DOI:https://doi.org/10.1103/PhysRevLett.110.156401