Stress-induced solid flow drives surface nanopatterning of silicon by ion-beam irradiation

M. Castro, R. Gago, L. Vázquez, J. Muñoz-García, and R. Cuerno
Phys. Rev. B 86, 214107 – Published 19 December 2012

Abstract

Ion-beam sputtering (IBS) is known to produce surface nanopatterns over macroscopic areas on a wide range of materials. However, in spite of the technological potential of this route to nanostructuring, the physical process by which these surfaces self-organize remains poorly understood. We have performed detailed experiments of IBS on Si substrates that validate dynamical and morphological predictions from a hydrodynamic description of the phenomenon. We introduce a systematic approach to perform the experiments under conditions that guarantee the applicability of a linear description, helping to clarify the experimental framework in which theories should be tested. Among our results, the pattern wavelength is experimentally seen to depend almost linearly on ion energy, in agreement with existing results for other targets that are amorphous or become so under irradiation. Our work substantiates flow of a nanoscopically thin and highly viscous surface layer, driven by the stress created by the ion beam, as an accurate description of this class of systems.

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  • Received 27 February 2012

DOI:https://doi.org/10.1103/PhysRevB.86.214107

©2012 American Physical Society

Authors & Affiliations

M. Castro1,*, R. Gago2, L. Vázquez2, J. Muñoz-García3, and R. Cuerno3

  • 1Grupo Interdisciplinar de Sistemas Complejos (GISC) and Grupo de Dinámica No Lineal (DNL), Escuela Técnica Superior de Ingeniería (ICAI), Universidad Pontificia Comillas, E-28015 Madrid, Spain
  • 2Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas, E-28049 Madrid, Spain
  • 3Departamento de Matemáticas and Grupo Interdisciplinar de Sistemas Complejos (GISC), Universidad Carlos III de Madrid, Avenida de la Universidad 30, E-28911 Leganés, Spain

  • *Corresponding author: marioc@upcomillas.es

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Issue

Vol. 86, Iss. 21 — 1 December 2012

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