Foreign exchange market data analysis reveals statistical features that predict price movement acceleration

Jose C. Nacher and Tomoshiro Ochiai
Phys. Rev. E 85, 056118 – Published 22 May 2012

Abstract

Increasingly accessible financial data allow researchers to infer market-dynamics-based laws and to propose models that are able to reproduce them. In recent years, several stylized facts have been uncovered. Here we perform an extensive analysis of foreign exchange data that leads to the unveiling of a statistical financial law. First, our findings show that, on average, volatility increases more when the price exceeds the highest (or lowest) value, i.e., breaks the resistance line. We call this the breaking-acceleration effect. Second, our results show that the probability P(T) to break the resistance line in the past time T follows power law in both real data and theoretically simulated data. However, the probability calculated using real data is rather lower than the one obtained using a traditional Black-Scholes (BS) model. Taken together, the present analysis characterizes a different stylized fact of financial markets and shows that the market exceeds a past (historical) extreme price fewer times than expected by the BS model (the resistance effect). However, when the market does, we predict that the average volatility at that time point will be much higher. These findings indicate that any Markovian model does not faithfully capture the market dynamics.

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  • Received 23 February 2012

DOI:https://doi.org/10.1103/PhysRevE.85.056118

©2012 American Physical Society

Authors & Affiliations

Jose C. Nacher*

  • Department of Information Science, Faculty of Science, Toho University, Miyama 2-2-1, Funabashi, Chiba 274-8510, Japan and Department of Complex and Intelligent Systems, Future University Hakodate, 116-2 Kamedanakano-cho, Hakodate 041-8655, Hokkaido, Japan

Tomoshiro Ochiai

  • School of Social Information Studies, Otsuma Women's University, 2-7-1 Karakida, Tama-shi, Tokyo 206-8540, Japan

  • *nacher@is.sci.toho-u.ac.jp
  • ochiai@otsuma.ac.jp

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Issue

Vol. 85, Iss. 5 — May 2012

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