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Domestic Proton Facilities for Radiation Testing of Electronics: Snapshot ReportThis is an update to the ongoing series of presentations tracking the state of domestic proton facility access for the purpose of single event effects (SEE) testing of microelectronics devices and systems. This includes proton research facilities and oncology therapy centers.



Document ID
20200000259
Acquisition Source
Goddard Space Flight Center
Document Type
Presentation
Authors
Label, Kenneth A. (Science Systems and Applications, Inc. (SSAI) Lanham, MD, United States)
Turflinger, Thomas (Aerospace Corp. Greenbelt, MD, United States)
Pellish, Jonathan A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
January 13, 2020
Publication Date
January 6, 2020
Subject Category
Space Sciences (General)
Report/Patent Number
GSFC-E-DAA-TN76820
Meeting Information
Meeting: JEDEC JC-13
Location: New Orleans, LA
Country: United States
Start Date: January 6, 2020
End Date: January 9, 2020
Sponsors: JEDEC Solid State Technology Association
Funding Number(s)
CONTRACT_GRANT: 80GSFC18C0120
Distribution Limits
Public
Copyright
Use by or on behalf of the US Gov. Permitted.

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