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3d Crystallographic Orientation of Olivine in Bjurböle ChondrulesThe crystallographic orientations of chondrule minerals can provide important insights into their formation and deformational history. For example, the orientations of the olivine bars and surrounding rim in barred olivine chondrules provide information and on the conditions of crystallization and the orientations and shapes of olivines within porphritic chondrules can record the reactions with the surrounding nebular gas during chondrule formation. Later deformation on the parent body can cause crystal-plastic deformation of chondrule minerals that is evident through their intracrystalline lattice misorientations. Typically these crystal orientations and lattice misorientations are determined using electron backscatter diffraction (EBSD) on thin sections but this gives only a 2D picture for what is actually a 3D texture. While it is possible to combine EBSD with serial sectioning to build a 3D dataset of texture, this is a destructive, time-intensive process. A recent technological development that enables non-destructive, 3D crystallographic orientation measurement is X-ray diffraction contrast tomography (DCT), which uses the X-ray diffraction of the crystal lattice to determine orientation. Originally only possible using monochromatic X-ray beams at 3rd generation synchrotron light sources, DCT has been recently adapted to polychromatic sources of laboratory X-ray microscopes (referred to as Lab-DCT). Up to this point LabDCT has only been applied to large, well-formed crystals of high symmetry (i.e., metals), but we recently acquired DCT datasets for a pair Bjurböle chondrules to determine the applicability of the technique to natural, mutlimineralic samples composed predominately of olivine (i.e., chondrules).
Document ID
20190027275
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Hanna, R. D. (The University of Texas at Austin Austin, TX, United States)
Ketcham, R. K. (The University of Texas at Austin Austin, TX, United States)
Zolensky, M. (NASA Johnson Space Center Houston, TX, United States)
Bale, H. (Carl Zeiss X-ray Microscopy, Inc. Pleasanton, CA, United States)
Sun, J. (Carl Zeiss X-ray Microscopy, Inc. Pleasanton, CA, United States)
Date Acquired
July 12, 2019
Publication Date
July 7, 2019
Subject Category
Lunar And Planetary Science And Exploration
Report/Patent Number
JSC-E-DAA-TN68323
Meeting Information
Meeting: Annual Meeting of the Meteoritical Society
Location: Sapporo
Country: Japan
Start Date: July 7, 2019
End Date: July 12, 2019
Sponsors: Meteoritical Society
Distribution Limits
Public
Copyright
Public Use Permitted.
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