X-Ray Micro-Tomography Applied to Nasa's Materials Research: Heat Shields, Parachutes and AsteroidsX-ray micro-tomography is used to support the research on materials carried out at NASA Ames Research Center. The technique is applied to a variety of applications, including the ability to characterize heat shield materials for planetary entry, to study the Earth- impacting asteroids, and to improve broadcloths of spacecraft parachutes. From micro-tomography images, relevant morphological and transport properties are determined and validated against experimental data.
Document ID
20170005798
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Panerai, Francesco (Analytical Mechanics Associates, Inc. Moffett Field, CA, United States)
Borner, Arnaud (Illinois Univ. Chicago, IL, United States)
Ferguson, Joseph C. (Science and Technology Corp. Moffett Field, CA, United States)
Mansour, Nagi N. (NASA Ames Research Center Moffett Field, CA United States)
Stern, Eric C. (NASA Ames Research Center Moffett Field, CA United States)
Barnard, Harold S. (California Univ., Lawrence Berkeley National Lab. Berkeley, CA, United States)
Macdowell, Alastair A. (California Univ., Lawrence Berkeley National Lab. Berkeley, CA, United States)
Parkinson, Dilworth Y. (California Univ., Lawrence Berkeley National Lab. Berkeley, CA, United States)
Date Acquired
June 28, 2017
Publication Date
June 26, 2017
Subject Category
Spacecraft Design, Testing And PerformanceChemistry And Materials (General)
Report/Patent Number
ARC-E-DAA-TN39049
Meeting Information
Meeting: International Conference on Tomography of Materials and Structures