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Use of Commercial FPGA-Based Evaluation Boards for Single-Event Testing of DDR2 and DDR3 SDRAMsWe investigate the use of commercial FPGA based evaluation boards for radiation testing DDR2 and DDR3 SDRAMs. We evaluate the resulting data quality and the tradeoffs involved in the use of these boards.
Document ID
20160000788
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
External Source(s)
doi:10.1109/TNS.2013.2285517
Authors
Ladbury, R. L. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Berg, M. D. (MEI Technologies, Inc. Seabrook, MD, United States)
Wilcox, E. P. (MEI Technologies, Inc. Seabrook, MD, United States)
LaBel, K. A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Kim, H. S. (MEI Technologies, Inc. Seabrook, MD, United States)
Phan, A. M. (MEI Technologies, Inc. Seabrook, MD, United States)
Seidleck, C. M. (MEI Technologies, Inc. Seabrook, MD, United States)
Date Acquired
January 13, 2016
Publication Date
December 1, 2013
Publication Information
Publication: (IEEE) Transaction on Nuclear Science (TNS)
Volume: 60
Issue: 6
Subject Category
Electronics And Electrical Engineering
Report/Patent Number
GSFC-500-13-d-0237
Distribution Limits
Public
Copyright
Public Use Permitted.

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