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Modeling Ellipsometry Measurements of Molecular Thin-Film Contamination on Genesis Array SamplesThe discovery of a molecular thin-film contamination on Genesis flown array samples changed the course of preliminary assessment strategies. Analytical techniques developed to measure solar wind elemental abundances must now compensate for a thin-film contamination. Currently, this is done either by experimental cleaning before analyses or by depth-profiling techniques that bypass the surface contamination. Inside Johnson Space Center s Genesis dedicated ISO Class 4 (Class 10) cleanroom laboratory, the selection of collector array fragments allocated for solar wind analyses are based on the documentation of overall surface quality, visible surface particle contamination greater than 1 m, and the amount of thin film contamination measured by spectroscopic ellipsometry. Documenting the exact thickness, surface topography, and chemical composition of these contaminates is also critical for developing accurate cleaning methods. However, the first step in characterization of the molecular film is to develop accurate ellipsometry models that will determine an accurate thickness measurement of the contamination film.
Document ID
20080029296
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Calaway, Michael J. (Jacobs Sverdrup Technology, Inc. Houston, TX, United States)
Stansbery, E. K. (NASA Johnson Space Center Houston, TX, United States)
McNamara, K. M. (NASA Johnson Space Center Houston, TX, United States)
Date Acquired
August 24, 2013
Publication Date
March 13, 2006
Subject Category
Lunar And Planetary Science And Exploration
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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