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The Effects of Architecture and Process on the Hardness of Programmable TechnologiesArchitecture and process, combined, significantly affect the hardness of programmable technologies. The effects of high energy ions, ferroelectric memory architectures, and shallow trench isolation are investigated. A detailed single event latchup (SEL) study has been performed.
Document ID
19990108581
Acquisition Source
Goddard Space Flight Center
Document Type
Other
Authors
Katz, Richard (NASA Goddard Space Flight Center Greenbelt, MD United States)
Wang, J. J. (Actel Corp. Sunnyvale, CA United States)
Reed, R. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Kleyner, I. (Orbital Sciences Corp. Greenbelt, MD United States)
DOrdine, M. (Ball Aerospace and Technologies Corp. Boulder, CO United States)
McCollum, J, (Actel Corp. Sunnyvale, CA United States)
Cronquist, B. (Actel Corp. Sunnyvale, CA United States)
Howard, J. (Jackson and Tull, Inc. Seabrook, MD United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1999
Subject Category
Computer Programming And Software
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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