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A mineralogical instrument for planetary applicationsThe mineralogy of a planetary surface can be used to identify the provenance of soil or sediment and reveal the volcanic, metamorphic and/or sedimentological history of a particular region. We have discussed elsewhere the applications and the instrument design of possible X-ray diffraction and X-ray fluorescence (XRD/XRF) devices for the mineralogical characterization of planetary surfaces. In this abstract we evaluate some aspects of sample-detector geometry and sample collection strategies.
Document ID
19940030902
Acquisition Source
Legacy CDMS
Document Type
Conference Paper
Authors
Blake, David F.
(NASA Ames Research Center Moffett Field, CA, United States)
Vaniman, David T.
(NASA Ames Research Center Moffett Field, CA, United States)
Bish, David L.
(NASA Ames Research Center Moffett Field, CA, United States)
Date Acquired
September 6, 2013
Publication Date
January 1, 1994
Publication Information
Publication: Lunar and Planetary Inst., The Twenty-Fifth Lunar and Planetary Science Conference. Part 1: A-G
Subject Category
Lunar And Planetary Exploration
Accession Number
94N35408
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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