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Segmented testingThe fraction of faults detected for a digital network is frequently high for the first few input combinations applied out of a set of test vectors. When the particular ordering of test patterns does not appreciably change the shape of the coverage curve, there appears to be an advantage to splitting the test into segments which are applied at different times. It is shown that the expected time to error detection and the probability of an undetected double error can be reduced. The amount of reduction is dependent on the shape of the fault coverage curve. It is conjectured that such a reduction can be obtained for VLSI networks.
Document ID
19840008787
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Robinson, J. P. (Iowa Univ. Iowa City, IA, United States)
Date Acquired
September 4, 2013
Publication Date
January 1, 1984
Subject Category
Numerical Analysis
Report/Patent Number
NASA-CR-173188
NAS 1.26:173188
Accession Number
84N16855
Funding Number(s)
CONTRACT_GRANT: NAG1-95
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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