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Interconnect fatigue design for terrestrial photovoltaic modulesThe results of comprehensive investigation of interconnect fatigue that has led to the definition of useful reliability-design and life-prediction algorithms are presented. Experimental data indicate that the classical strain-cycle (fatigue) curve for the interconnect material is a good model of mean interconnect fatigue performance, but it fails to account for the broad statistical scatter, which is critical to reliability prediction. To fill this shortcoming the classical fatigue curve is combined with experimental cumulative interconnect failure rate data to yield statistical fatigue curves (having failure probability as a parameter) which enable (1) the prediction of cumulative interconnect failures during the design life of an array field, and (2) the unambiguous--ie., quantitative--interpretation of data from field-service qualification (accelerated thermal cycling) tests. Optimal interconnect cost-reliability design algorithms are derived based on minimizing the cost of energy over the design life of the array field.
Document ID
19820014784
Acquisition Source
Legacy CDMS
Document Type
Contractor Report (CR)
Authors
Mon, G. R. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Moore, D. M. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Ross, R. G., Jr. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA, United States)
Date Acquired
September 4, 2013
Publication Date
March 1, 1982
Subject Category
Energy Production And Conversion
Report/Patent Number
NAS 1.26:168813
DOE/JPL-1012-62
JPL-PUB-81-111
JPL-1012-62
NASA-CR-168813
Accession Number
82N22658
Funding Number(s)
CONTRACT_GRANT: DE-AI01-76ET-20356
CONTRACT_GRANT: NAS7-100
PROJECT: RTOP 776-52-61
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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