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An X-ray fluorescence spectrometer and its applications in materials studiesAn X-ray fluorescence system based on a Co(57) gamma-ray source has been developed. The system was used to calculate the atomic percentages of iron implanted in titanium targets. Measured intensities of Fe (k-alpha + k-beta) and Ti (k-alpha + k-beta) X-rays from the Fe-Ti targets are in good agreement with the calculated values based on photoelectric cross sections of Ti and Fe for the Co(57) gamma rays.
Document ID
19770023977
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Singh, J. J. (NASA Langley Research Center Hampton, VA, United States)
Han, K. S. (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 3, 2013
Publication Date
August 1, 1977
Subject Category
Atomic And Molecular Physics
Report/Patent Number
NASA-TM-74062
Accession Number
77N30921
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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