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Degradation of transistor performance due to passage of small-Coulomb high-voltage surgesHigh voltage pulse causing beta degradation and junction resistance drop in transistor
Document ID
19660030238
Acquisition Source
Legacy CDMS
Document Type
Technical Memorandum (TM)
Authors
Garrahan, N. M.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
September 2, 2013
Publication Date
September 1, 1966
Subject Category
Electronic Equipment
Report/Patent Number
NASA-TM-X-55572
X-711-66-449
Accession Number
66N39528
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
ELECTRIC PULSE
FAILURE MODE
JUNCTION TRANSISTOR
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