Elsevier

Surface Science

Volume 277, Issue 3, 20 October 1992, Pages 359-369
Surface Science

Calculations of ionization rate-constants for the field-ion microscope

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Abstract

Ionization rate-constants are calculated for the field-ion microscope using the JWKB method and tunnelling potential introduced by Haydock and Kingham [Surf. Sci. 103 (1981) 239]. The expression for the tunnelling rate-constant given by Haydock and Kingham is inaccurate and we present a new and reliable formula. The prefactor for the tunnelling rate-constant is also calculated by comparing with the ionization rate-constant in a uniform electric field. The resulting rate-constants for helium atoms are significantly larger than those obtained by Kingham and coworkers [J. Phys. (Paris) 45 (1984) 77]. Our results make it possible to calculate ionization rate-constants in the field-ion microscope with greater accuracy than was previously possible.

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