Structural characterization of CoCu multilayers grown by laser ablation deposition

doi:10.1016/0304-8853(93)91155-Z

Journal of Magnetism and Magnetic Materials

Volume 121, Issues 1–3, 2 March 1993, Pages 83-87

https://doi.org/10.1016/0304-8853(93)91155-Z Get rights and content

Abstract

Multilayers of 25×(1.0 nm Cu/1.6 nm Co) have been grown on Si(100) substrates by the method of laser ablation deposition. A structural characterization of the superlattices has been performed using XRD and TEM. It is found that multilayers with strong preferential orientation ((100) on Cu buffer layers and (111) on Fe buffer layers) can be grown.

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Structural characterization of CoCu multilayers grown by laser ablation deposition

Abstract

J. Magn. Magn. Mater.

J. Magn. Magn. Mater.

J. Magn. Magn. Mater.

Opt. Commun.

Sov. Phys. Tech. Phys.

Appl. Phys. Lett.

Phys. Rev. B

Phys. Rev. Lett.