Elsevier

Applications of Surface Science

Volume 17, Issue 2, November–December 1983, Pages 241-248
Applications of Surface Science

Surface concentration changes in Cu-Zn alloys under ion bombardment

https://doi.org/10.1016/0378-5963(83)90037-5Get rights and content

Abstract

We have measured the depth profile of a Cu-48.2at%Zn alloy by means of Auger Electron Spectroscopy combined with Ar+ ion bombardment. We have also measured the steady state surface concentration for different ion energies, and the transient variation of surface concentration when ion energies were changed from 0.5 to 5 keV and vice versa. We found that the effect of altered layer thickness and the Auger electron escape depth can produce an incorrect measurement of the preferential sputtering energy dependence. We also found that the presence of a strong preferential sputtering can shadow AES measurement of concentration variations along a depth profile.

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Miembro de la Carrera del Investigador del Consejo Nacional de Investigaciones Científicas y Técnicas (CONICET), Rep. Argentina.

∗∗

Becario del CONICET.

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