Elsevier

Applied Surface Science

Volume 73, 2 November 1993, Pages 237-242
Applied Surface Science

Optical and electrical characterization of VSi2 and NbSi2 single crystals

https://doi.org/10.1016/0169-4332(93)90172-8Get rights and content

Abstract

VSi2 and NbSi2 Czochralski-grown single crystals were characterized by optical and transport techniques. Near-normal-polarized reflectivity and spectroscopic ellipsometry were used to determine the complex refractive index from 0.01 to 6 eV. Moreover, resistivity over the 4.2–800 K temperature range was measured along two different crystallographic directions. The results show anisotropy in both the optical and electrical response, and some differences between single crystals and polycrystalline thin films are emphasized.

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