Bragg and diffuse components of X-ray reflection measured using acoustic excitation of an Si crystal with oxide precipitates

Bragg and diffuse scattering contributions to a reflection can be separated using the intensity dependence on the amplitude of transverse ultrasound excited in the crystal. The method is based on the fact that a weak ultrasound with wavelength equal to the extinction length suppresses almost completely the anomalous transmission of the coherent (Bragg) beam in a sufficiently thick absorbing crystal and does not affect diffuse scattering. Both parameters characterizing diffraction in a slightly imperfect crystal, the static Debye-Waller factor and the coefficient of additional absorption due to diffuse scattering, have been determined for a silicon crystal containing oxide precipitates after heat treatment.