A simple computer method for the orientation of single crystals of any structure using Laue back-reflection X-ray photographs

A simple computer program for the simulation and analysis of X-ray back-reflection Laue photographs of a single crystal with any structure and orientation has been developed in Fortran IV. Comparison of computer plots of the calculated patterns with the photographs enables rapid identification of approximate orientation. The program may ultimately be used to index an orientation from the identification of at least three spots from the photographs. The procedure incorporating use of the program requires only minimal knowledge of crystallography or computer methods.