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X-ray photoelectron spectroscopy and near-edge X-ray-absorption fine structure of C60 polymer films

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Abstract.

We report core-level and valence-band X-ray photoelectron spectroscopy (XPS) and carbon [ ]K near-edge X-ray-absorptionfine structure spectroscopy (NEXAFS) results of plasma-polymerized C60. In comparison with evaporated C60 the C 1s peak is broader and asymmetric for the C60 polymer and its shake-up satellites diminished. Furthermore, the features of the valence-band as well as the features of the π* antibonding orbitals of the C60 polymer are broader and reduced in intensity. Changes in the electronic structure are attributed to the polymerization of C60, the post-plasma functionalization of the surface by oxygen after exposure to atmosphere, and the occurrence of amorphous carbon.

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Authors and Affiliations

  1. Sony Corporation Frontier Science Laboratories, 2-1-1, Shinsakuragaoka, Hodogaya-ku, Yokohama-shi 240-0036, Japan (Fax: +81-45/353-6904, E-mail: Matthias.Ramm@jp.sony.com), , , , , , JP

    M. Ramm & M. Ata

  2. Bundesanstalt für Materialforschung und -prüfung, Unter den Eichen 44-46, 12203 Berlin, Germany, , , , , , DE

    T. Gross & W. Unger

Authors
  1. M. Ramm
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  2. M. Ata
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  3. T. Gross
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  4. W. Unger
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Received: 28 May 1999 / Accepted: 31 August 1999 / Published online: 8 March 2000

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Ramm, M., Ata, M., Gross, T. et al. X-ray photoelectron spectroscopy and near-edge X-ray-absorption fine structure of C60 polymer films. Appl Phys A 70, 387–390 (2000). https://doi.org/10.1007/s003390051053

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  • DOI: https://doi.org/10.1007/s003390051053

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