Abstract
For the trace analysis of impurities in thick ceramic layers of a solid oxide fuel cell (SOFC) sensitive solid-state mass spectrometric methods, such as laser ablation inductively coupled plasma mass spectrometry (LA-ICP-MS) and radiofrequency glow discharge mass spectrometry (rf-GDMS) have been developed and used. In order to quantify the analytical results of LA-ICP-MS, the relative sensitivity coefficients of elements in a La0.6Sr0.35MnO3 matrix have been determined using synthetic standards. Secondary ion mass spectrometry (SIMS) – as a surface analytical method – has been used to characterize the element distribution and diffusion profiles of matrix elements on the interface of a perovskite/Y-stabilized ZrO2 layer. The application of different mass spectrometric methods for process control in the preparation of ceramic layers for the SOFC is described.
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Becker, J.S., Breuer, U., Westheide, J. et al. Trace and surface analysis of ceramic layers of solid oxide fuel cells by mass spectrometry. Fresenius J Anal Chem 355, 626–632 (1996). https://doi.org/10.1007/s0021663550626
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DOI: https://doi.org/10.1007/s0021663550626