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Excitons in heteroepitaxial CdSe/CdS structures

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Abstract

X-ray diffractometry and low-temperature exciton spectroscopy are used to study heteroepitaxial CdSe/CdS layers grown at temperatures of 350–485 °C by MOCVD. The high-temperature samples are found to display the exciton and x-ray diffraction spectra characteristic of hexagonal Wurtzite (W) structures, while the low-temperature samples display the features characteristic of the cubic structure of sphalerite (ZB). A number of the samples have x-ray spectra characteristic of structures with stacking faults (SF), which represent a separate crystalline phase in the structures studied here. It is found that the individual crystalline phases are spatially separated.

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References

  1. E. F. Gross, B. S. Razbirin, V. P. Fedorov, and Yu. P. Naumov, Phys. Status Solidi 30, 485 (1968).

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Authors and Affiliations

  1. Baltic State Technical University, 198005, St. Petersburg, Russia

    D. L. Fedorov & E. P. Denisov

  2. A. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, 194021, St. Petersburg, Russia

    L. N. Tenishev & M. B. Chernyshov

  3. Institute of Radio Electronics, Russian Academy of Sciences, 141120, Fryazino, Moscow Region, Russia

    P. I. Kuznetsov & G. G. Yakushcheva

Authors
  1. D. L. Fedorov
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  2. E. P. Denisov
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  3. L. N. Tenishev
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  4. M. B. Chernyshov
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  5. P. I. Kuznetsov
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  6. G. G. Yakushcheva
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Additional information

Fiz. Tverd. Tela (St. Petersburg) 40, 887–889 (May 1998)

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Fedorov, D.L., Denisov, E.P., Tenishev, L.N. et al. Excitons in heteroepitaxial CdSe/CdS structures. Phys. Solid State 40, 816–818 (1998). https://doi.org/10.1134/1.1130408

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  • DOI: https://doi.org/10.1134/1.1130408

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