Abstract
The results of investigations of the transverse Kerr effect on an array of thin magnetic strips deposited on a silicon substrate are reported. The periodic structure of the sample gives rise to diffraction. It is observed that under certain experimental conditions the magnitude of the effect measured in diffracted beams is much greater than the maximum value for a sample with a uniform surface.
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Pis’ma Zh. Éksp. Teor. Fiz. 66, No. 7, 466–469 (10 October 1997)