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Spectroscopic, electrical and EPR studies of binary semiconducting oxide glasses containing 50 mol% V2O5

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Abstract

Recent measurements on the V2O5-GeO2 glass system consisting of an equimolar mixture of V2O5 and GeO2 revealed that increase in electrical conductivity of these glasses upon annealing could be attributed to the increase in V4+ and V3+ content which accompanied the microstructure formation. In the present work we report a similar study on V2O5-TeO2 and V2O5-P2O5 glass systems. It was found that in tellurite glass V3+ content increased upon annealing and V4+ content remained unchanged. In phosphate glass some increase in V4+ and no significant change in V3+ contents were observed. V3+ and V4+ contents in glasses could be best estimated from optical and electron paramagnetic resonance spectra, respectively.

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Authors and Affiliations

  1. Physics Department, University of Petroleum and Minerals, Dhahran, Saudi Arabia

    E. E. Khawaja, M. Sakhawat Hussain, M. A. Khan & J. S. Hwang

  2. Chemistry Department, University of Petroleum and Minerals, Dhahran, Saudi Arabia

    M. Sakhawat Hussain & J. S. Hwang

Authors
  1. E. E. Khawaja
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  2. M. Sakhawat Hussain
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  3. M. A. Khan
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  4. J. S. Hwang
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Khawaja, E.E., Hussain, M.S., Khan, M.A. et al. Spectroscopic, electrical and EPR studies of binary semiconducting oxide glasses containing 50 mol% V2O5 . J Mater Sci 21, 2812–2818 (1986). https://doi.org/10.1007/BF00551494

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  • DOI: https://doi.org/10.1007/BF00551494

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