Muonium centers in heavily n‐doped Si under illumination: Evidence for Mu–hole interaction

Abstract

A small fraction of implanted muons exists as a paramagnetic state (presumably Mu_BC ⁰, muonium at the Si—Si bond center) in heavily Sb‐doped Si (n-type, [Sb]\ \simeq 10¹⁸\ cm^–3). The paramagnetic state is susceptible to illumination both at 10–20 K and 290 K, providing evidence that holes (minority carriers) play an important role in determining the dynamical properties of muonium centers, where change may occur via a process Mu_BC ⁰+ h⁺\to Mu_BC ⁺ followed by charge exchange reaction (or transition Mu⁺ _BC+ e⁻→ Mu⁰ _T).