ExLibris header image
SFX Logo
Title: The Impact of Altimeter Sampling Patterns on Estimates of Background Errors in a Global Wave Model
Source:

Journal of Atmospheric and Oceanic Technology [0739-0572] Greenslade, Diana J. M. yr:2005


Collapse list of basic services Basic
Full text
Full text available via American Meteorological Society
GO
Document delivery
Request document via Library/Bibliothek GO

Expand list of advanced services Advanced
A service provided by the Library of the Wissenschaftspark Albert Einstein, Potsdam, Germany.
© 2005 SFX by Ex Libris Inc.