Interference of parametric X-ray and coherent Bremsstrahlung radiation from nonrelativistic electrons: application to the phase analysis in crystallography

The intensity of coherent X-radiation (CXR) from a relativistic electron beam interacting with the crystal [Feranchuk, Ulyanenkov, Harada & Spence (2000). Phys. Rev. E, 62, 4225-4234] is studied in view of its application to the phase determination problem. The analysis of CXR spectra is shown to permit an independent measurement of unit-cell structure factors, defined by both the electron-density distribution and the nucleus positions. In relation to these structure factors, two new types of Patterson function are introduced that can simplify the solution of crystal structure.