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Temperature-dependent interface reactions and electrical contact properties of titanium on 6H-SiC

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, , Citation F Goesmann and R Schmid-Fetzer 1996 Semicond. Sci. Technol. 11 461 DOI 10.1088/0268-1242/11/3/028

This is a correction for 1995 Semicond. Sci. Technol. 10 1652

0268-1242/11/3/461

Abstract

Unintentional interference patterns appeared in the four secondary electron images in this paper. The figures should appear as on this page.

 

Figure 2. A secondary electron image of a cross sectioned reaction zone between SiC and Ti annealed at 1200°C for 24 h. The ternary phase τ is T13SiC2.

 1200°C

Figure 4. A secondary electron image of a cross sectioned reaction zone between SiC and Ti annealed at 1000°C for 144 h. The ternary phase τ is T13SiC2.

 τ

Figure 5. A secondary electron image of a cross sectioned reaction zone between SiC and Ti annealed at 850°C for 1032 h. The ternary phase τ is T13SiC2.

 T13SiC2

Figure 7. A secondary electron image of a cross sectioned reaction zone between SiC and Ti annealed at 700°C for 1704 h.

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10.1088/0268-1242/11/3/028