Abstract
The core-level electronic structures of exfoliated graphene sheets on a Au-coated SiOx substrate have been studied using synchrotron radiation photoelectron spectroscopy (SR-PES) on a micron scale. The graphene's visibility on the Au-coated SiOx substrate was first demonstrated by micro optical characterization, and then an SR-PES study was conducted. Because of the elimination of charging effect, a precise C 1s core-level characterization shows graphitic and contaminated carbon states of graphene. Different levels of Au-coating-induced p-type doping on single- and double-layer graphene sheets were also examined in the C 1s core-level shift. The Au-coated SiOx substrate can be treated as a simple but high-throughput platform for in situ studying graphene under further hybridization by PES.