Abstract
The relevant aspects of electrical noise in metals related to the kinetic properties of lattice defects are presented. Two basic phenomena are considered: (a) resistivity fluctuations in thermal equilibrium associated with vacancy creation and annihilation processes, (b) resistivity fluctuations generated by collective dislocation rearrangements during plastic deformation. It is shown that, through the characterization of the fluctuations with a suitable statistical model, information can be obtained on the physical properties of these defects. In particular, vacancy parameters, such as the migration energy, the average life-time and the resistivity contribution of unit vacancy concentration can be experimentally determined. Moreover, the relevant features associated with dislocation rearrangement processes during plastic deformation are put in evidence.
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