Interference-Enhanced Raman Scattering of Very Thin Titanium and Titanium Oxide Films

R. J. Nemanich, C. C. Tsai, and G. A. N. Connell
Phys. Rev. Lett. 44, 273 – Published 28 January 1980
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Abstract

The Raman spectra of very thin evaporated films (∼6 nm thick) of metallic titanium and oxidized titanium are obtained with a new technique called interference-enhanced Raman scattering. The results indicate that titanium films exhibit a crystalline hcp structure while the titanium oxide has an amorphous structure with local atomic bonding configurations similar to those in crystalline Ti2O3.

  • Received 25 September 1979

DOI:https://doi.org/10.1103/PhysRevLett.44.273

©1980 American Physical Society

Authors & Affiliations

R. J. Nemanich, C. C. Tsai, and G. A. N. Connell

  • Xerox Palo Alto Research Center, Palo Alto, California 94304

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Issue

Vol. 44, Iss. 4 — 28 January 1980

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