Corrected Values of Tungsten K-Series X-Ray Wavelengths with the 2-Meter Curved Crystal Diffraction Spectrometer

Philip Snelgrove, Jassim El-Hussaini, and Jesse W. M. DuMond
Phys. Rev. 95, 1203 – Published 1 September 1954
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Abstract

Certain minor mechanical errors occasioned by small flexures in some components of our 2-meter curved crystal γ-ray spectrometer were discovered recently through comparison of wavelength measurements in different orders of reflection. These errors and the means adopted for their correction have been described in published papers and a program of redeterminations of nuclear γ and x-ray wavelengths is underway. In this program, a by-product of the study of the radioisotope Ta182 has led to measurements of the tungsten K-series x-ray lines, since tungsten is the daughter product of β decay of Ta182. In this way we have obtained the following results: WKα2=213.387±0.010; WKα1=208.575±0.008; WKβ3=184.785±0.027; WKβ1=183.997±0.019 all expressed in x.u. (Siegbahn). The agreement with other measurements, particularly those given in E. Ingelstam's dissertation (1937), is now well within the estimated standard deviation of our measurements, and to avoid further confusion (because our earlier values disagreed slightly from Ingelstam's) we wish to announce that our earlier results [published in Phys. Rev. 75, 505 (1949)] are herewith superseded by these present ones.

  • Received 17 May 1954

DOI:https://doi.org/10.1103/PhysRev.95.1203

©1954 American Physical Society

Authors & Affiliations

Philip Snelgrove, Jassim El-Hussaini, and Jesse W. M. DuMond

  • California Institute of Technology, Pasadena, California

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Issue

Vol. 95, Iss. 5 — September 1954

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