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Origin of itinerant carriers in antiferromagnetic LaFe1xMoxO3 studied by x-ray spectroscopies

Dibya Phuyal, Soham Mukherjee, S. K. Panda, Somnath Jana, Carlo U. Segre, Laura Simonelli, Sergei M. Butorin, Håkan Rensmo, and Olof Karis
Phys. Rev. Materials 4, 034405 – Published 13 March 2020
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Abstract

We report on the electronic structure of doped LaFeO3 at the crossover from an insulating-to-metallic phase transition. Comprehensive x-ray spectroscopic methodologies are used to understand core and valence electronic structure as well as crystal structure distortions associated with the electronic transition. Despite the antiferromagnetic (AFM) ordering at room temperature, we show direct evidence of itinerant carriers at the Fermi level revealed by resonant photoemission spectroscopy (RPES) at the Mo L3 edge. RPES data taken at the Fe L3 edge show spectral weight near the valence band edge and significant hybridization with O 2p states required for AFM ordering. Resonant inelastic x-ray scattering spectra taken across Fe L2,3 edges show electron correlation effects (U) driven by Coulomb interactions of d electrons as well as broad charge-transfer excitations for x0.2 where the compound crosses over to a metallic state. Site substitution of Fe by Mo ions in the Fe-O6 octahedra enhances the separation of the two Fe-O bonds and Fe-O-Fe bonding angles relative to the orthorhombic LaFeO3, but no considerable distortions are present to the overall structure. Mo ions appear to be homogeneously doped, with average valency of both metal sites monotonically decreasing with increasing Mo concentration. This insulator-to-metal phase transition with AFM stability is primarily understood through intermediate interaction strengths between correlation (U) and bandwidth (W) at the Fe site, where an estimation of this ratio is given. These results highlight the important role of extrinsic carriers in stabilizing a unique phase transition that can guide future efforts in antiferromagnetic-metal spintronics.

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  • Received 22 October 2019
  • Revised 10 February 2020
  • Accepted 18 February 2020

DOI:https://doi.org/10.1103/PhysRevMaterials.4.034405

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI. Funded by Bibsam.

Published by the American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Dibya Phuyal1,*, Soham Mukherjee1, S. K. Panda2, Somnath Jana1,†, Carlo U. Segre3, Laura Simonelli4, Sergei M. Butorin1, Håkan Rensmo1, and Olof Karis1

  • 1Division of Molecular and Condensed Matter Physics, Department of Physics, Uppsala University, Box 516, SE-75121, Uppsala, Sweden
  • 2Department of Physics, Bennett University, Greater Noida 201310, Uttar Pradesh, India
  • 3CSRRI and Department of Physics, Illinois Institute of Technology, Chicago, Illinois 60616, USA
  • 4CELLS-ALBA Synchrotron, E-08290 Cerdanyola del Vallés, Barcelona, Spain

  • *dibya.phuyal@physics.uu.se
  • Present address: Methods and Instrumentation for Synchrotron Radiation, Helmholtz-Zentrum Berlin, 12489 Berlin, Germany.

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Issue

Vol. 4, Iss. 3 — March 2020

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