Abstract
We report on magnetotransport properties on tunnel junctions grown epitaxially on top of (001)-oriented substrates by sputtering. It is shown that the magnetoresistive response depends critically on the interfacial properties. The appearance of an layer by the interface destroys the symmetry filtering effect of the system and only a small negative tunneling magnetoresistance (TMR) is measured. However, in annealed samples a switchover from positive TMR ( at 70 K) to negative TMR is observed around 120 K. This change is associated with the transition from semiconducting at high to insulating at low taking place at the Verwey transition in thus suggesting the formation of a very thin slab of magnetite at the interface during annealing treatments. These results highlight the relevance of interfacial properties on the tunneling conduction process and how it can be substantially modified through appropriate interface engineering.
1 More- Received 12 March 2015
- Revised 18 June 2015
DOI:https://doi.org/10.1103/PhysRevB.92.094428
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