SFX by Ex Libris Inc.

Users interested in this article also expressed an interest in the following:
description	1.	Hruszkewycz, S O. "High-resolution three-dimensional structural microscopy by single-angle Bragg ptychography." Nature Materials 16.2 (2016): 244-251.
description	2.	Hruszkewycz, S O. "Quantitative Nanoscale Imaging of Lattice Distortions in Epitaxial Semiconductor Heterostructures Using Nanofocused X-ray Bragg Projection Ptychography." Nano letters 12.10 (2012): 5148-54.
description	3.	Takahashi, Y. "Bragg x-ray ptychography of a silicon crystal: Visualization of the dislocation strain field and the production of a vortex beam." Physical review. B, Condensed matter and materials physics 87.12 (2013): 121201-.
description	4.	Hruszkewycz, S. "Framework for three-dimensional coherent diffraction imaging by focused beam x-ray Bragg ptychography." Optics letters 36.12 (2011): 2227-2229.
description	5.	Edo, T B. "Noise limit on practical electron ptychography." Journal of physics. Conference series 241.1 (2010): 12065-.
description	6.	Rodenburg, J. "A phase retrieval algorithm for shifting illumination." Applied physics letters 85.20 (2004): 4795-4797.
description	7.	Vartanyants, IA. "Partial coherence effects on the imaging of small crystals using coherent x-ray diffraction." Journal of physics. Condensed matter 13.47 (2001): 10593-10611.

Select All Clear All Save Citations

Physical Review B [2469-9950] Shabalin, A G yr:2017