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Title:
Ge–Sb–Te thin films deposited by pulsed laser: An ellipsometry and Raman scattering spectroscopy study
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Journal of Applied Physics [0021-8979] Němec, P yr:2009
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Němec, P
Moreac, A
Nazabal, V
Pavlišta, M
Přikryl, J
Frumar, M
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author:
Němec, P
Moreac, A
Nazabal, V
Pavlišta, M
Přikryl, J
Frumar, M
last name
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author:
Němec, P
Moreac, A
Nazabal, V
Pavlišta, M
Přikryl, J
Frumar, M
last name
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