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Title:
Model for the voltage and temperature dependence of the soft breakdown current in ultrathin gate oxides
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Journal of Applied Physics [0021-8979] Avellán, A yr:2005
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Avellán, A
Miranda, E
Schroeder, D
Krautschneider, W
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Miranda, E
Schroeder, D
Krautschneider, W
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Miranda, E
Schroeder, D
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