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Si/SiO2 interface roughness: Comparison between surface second harmonic generation and x-ray scattering
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Applied Physics Letters [0003-6951] Cundiff, S T yr:1997
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author:
Cundiff, S T
Knox, W H
Baumann, F H
Evans-Lutterodt, K W
Green, M L
van Driel, H M
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author:
Cundiff, S T
Knox, W H
Baumann, F H
Evans-Lutterodt, K W
Green, M L
van Driel, H M
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initials
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author:
Cundiff, S T
Knox, W H
Baumann, F H
Evans-Lutterodt, K W
Green, M L
van Driel, H M
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