ExLibris header image
SFX Logo
Title: Dimensional effects and scalability of Meta-Stable Dip (MSD) memory effect for 1T-DRAM SOI MOSFETs
Source:

Solid-State Electronics [0038-1101] Hubert, A yr:2009


Collapse list of basic services Basic
Sorry, no full text available...
Please use the document delivery service (see below)  
Holding information
Holdings in library search engine ALBERT GO
Document delivery
Request document via Library/Bibliothek GO
Users interested in this article also expressed an interest in the following:
1. Reisch, M. "On bistable behavior and open-base breakdown of bipolar transistors in the avalanche regime-modeling and applications." IEEE Transactions on Electron Devices 39.6 (1992): 1398-1409. Link to SFX for this item
Select All Clear All

Expand list of advanced services Advanced
A service provided by the Library of the Wissenschaftspark Albert Einstein, Potsdam, Germany.
© 2005 SFX by Ex Libris Inc.