Current-induced depairing in the Bi2Te3/FeTe interfacial superconductor

M. N. Kunchur, C. L. Dean, N. Shayesteh Moghadam, J. M. Knight, Q. L. He, H. Liu, J. Wang, R. Lortz, I. K. Sou, and A. Gurevich
Phys. Rev. B 92, 094502 – Published 1 September 2015

Abstract

We investigated current induced depairing in the Bi2Te3/FeTe topological insulator-chalcogenide interface superconductor. The measured depairing current density provides information on the magnetic penetration depth and superfluid density, which in turn shed light on the nature of the normal state that underlies the interfacial superconductivity.

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  • Received 4 June 2015

DOI:https://doi.org/10.1103/PhysRevB.92.094502

©2015 American Physical Society

Authors & Affiliations

M. N. Kunchur*, C. L. Dean, N. Shayesteh Moghadam, and J. M. Knight

  • Department of Physics and Astronomy, University of South Carolina, Columbia, South Carolina 29208, USA

Q. L. He, H. Liu, J. Wang, R. Lortz, and I. K. Sou

  • William Mong Institute of Nano Science and Technology, the Hong Kong University of Science and Technology, Hong Kong, China

A. Gurevich

  • Department of Physics, Old Dominion University, Norfolk, Virginia 23529, USA

  • *Corresponding author: kunchur@sc.edu; http://www.physics.sc.edu/∼kunchur

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Issue

Vol. 92, Iss. 9 — 1 September 2015

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