X. Q. Liu1, X. B. Li2, L. Zhang1, Y. Q. Cheng3, Z. G. Yan1, M. Xu3, X. D. Han1, S. B. Zhang2,4, Z. Zhang1,5, and E. Ma3
- 1Institute of Microstructure and Property of Advanced Materials Beijing University of Technology Beijing, 100124, China
- 2State Key Laboratory on Integrated Optoelectronics College of Electronic Science and Engineering Jilin University Changchun 130012, China
- 3Department of Materials Science and Engineering Johns Hopkins University Baltimore, Maryland 21218, USA
- 4Department of Physics, Applied Physics, and Astronomy Rensselaer Polytechnic Institute Troy, New York 12180, USA
- 5State Key Laboratory of Silicon Materials Department of Materials Sciences and Engineering Zhejiang University Hangzhou 310027, China