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Electromagnetic Detection of Fatigue Cracks under Protruding Head Ferromagnetic FastenersThe detection of fatigue cracks under installed fasteners has been a major goal of the aging aircraft NDE community. The Sliding Probe, Magneto-Optic Imager, Rotating Self-Nulling Probe, Low Frequency Eddy Current Array, and Eddyscan systems are among the instruments developed for this inspection. It has been verified that the detection of fatigue cracks under flush head aluminum and titanium fasteners can be accomplished with a high resolution by the above techniques. The detection of fatigue cracks under ferromagnetic and protruding head fasteners, however, has been found to be much more difficult. For the present work, the inspection for fatigue cracks under SAE 4340 Steel Hi-Lok fasteners is explored. Modifications to the Rotating Self-Nulling Eddy Current Probe System are presented which enable the detection of fatigue cracks hidden under the protruding head of the ferromagnetic fastener. Inspection results for samples with varying length EDM notches are shown, as well as a comparison between the signature from an EDM notch and an actual fatigue crack. Finite Element Modeling is used to investigate the effect of the ferromagnetic fastener on the induced eddy current distribution in order to help explain the detection characteristics of the system. This paper will also introduce a modification to the Rotating Probe System designed specifically for the detection of deeply buried flaws in multilayer conductors. The design change incorporates a giant magnetoresistive (GMR) sensor as the pickup device to improve the low frequency performance of the probe. The flaw detection capabilities of the GMR based Self- Nulling Probe are presented along with the status of the GMR based Rotating Probe System for detection of deeply buried flaws under installed fasteners.
Document ID
20040086676
Acquisition Source
Langley Research Center
Document Type
Other
Authors
Wincheski, Buzz (NASA Langley Research Center Hampton, VA, United States)
Namkung, Min (NASA Langley Research Center Hampton, VA, United States)
Date Acquired
September 7, 2013
Publication Date
January 1, 2004
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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