ExLibris header image
SFX Logo
Source:

Methodische Ansätze zur unscharfen Mustererkennung bei Deformationsmessergebnissen [3-926146-22-2] Fletling, Rainer

yr:2010 pg:124 -XVS.

Collapse list of basic services Basic
Sorry, no full text available...
Please use the document delivery service (see below)  
Document delivery
Request document via Library/Bibliothek GO
Citation information
Check Google Book Search GO

Expand list of advanced services Advanced
A service provided by the Library of the Wissenschaftspark Albert Einstein, Potsdam, Germany.
© 2005 SFX by Ex Libris Inc.