Abstract
In the scanning electron microscope the electron channeling patterns allow us to determine the orientation and quality of single crystal objects. If the Auger spectrometer is equipped with a scanning sample positioner, the electron channeling patterns can be observed with primary energies used in Auger spectroscopy, i.e. 0.5–5 keV.
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Seiler, H., Kuhnle, G. & Bauer, H. Beobachtung von Elektronen-Channeling-Diagrammen im Augerelektronen-Spektrometer mit Rasterzusatz. Appl. Phys. 6, 167–171 (1975). https://doi.org/10.1007/BF00883746
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DOI: https://doi.org/10.1007/BF00883746